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Secondary ion mass spectrometry
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#	Item
21	Photon Factory Activity Report 2012 #B BL-2C/2010G541 A High-Resolution 2p→3d Photoexcitation Spectrum of Atomic Mn Ken KAWAJIRI1, Satoshi KOSUGI1, Norihiro SUZUKI1, Minato KENMOTSU1, Tatsuro NAGOSHI1 Add to Reading List Source URL: pfwww.kek.jp Language: English - Date: 2013-09-26 20:31:26 Materials science Measuring instruments Chemical pathology Time of flight Photoelectrochemical processes Mass spectrum Time-of-flight mass spectrometry Static secondary-ion mass spectrometry Chemistry Mass spectrometry Spectroscopy
22	OXFORD APPLIED RESEARCH Low Energy Ion Source- LIon50 Specimen cleaning, Ion spectroscopy. 30eV - 1keV Add to Reading List Source URL: www.oaresearch.co.uk Language: English - Date: 2015-04-23 17:42:59 Ions Thin film deposition Mass spectrometry Ion source Semiconductor device fabrication Ion beam Electron Ion gun Static secondary-ion mass spectrometry Chemistry Physics Scientific method
23	Senior Bursary Award 7th Biennial Geo-SIMS workshop for Secondary Ion Mass Spectrometry at the GeoForschungsZentrum Potsdam and following Goldschmidt Conference in Florence Cees-Jan De Hoog, Edinburgh Ion Microprobe Fac Add to Reading List Source URL: www.minersoc.org Language: English - Date: 2014-01-29 10:46:42 Boron Secondary ion mass spectrometry Uranium-lead dating Zircon Cameca Atom probe Resolution Chemistry Mass spectrometry Scientific method
24	728 Goldschmidt Conference Abstracts Approaching the final frontier in lateral resolution for isotopic and Add to Reading List Source URL: goldschmidt.info Language: English - Date: 2011-09-22 14:59:10 Geology Ultramafic rocks Cratons Peridotite Garnet Secondary ion mass spectrometry Chemistry Mass spectrometry Scientific method
25	Microsoft Word - Exp PhysicsWinter Syllabus.doc Add to Reading List Source URL: www.pdx.edu Language: English - Date: 2013-03-09 14:35:09 Chemistry Scientific method Electron microscopy Focused ion beam Ultra-high vacuum Machining Ion beam Secondary ion mass spectrometry SB Semiconductor device fabrication Thin film deposition Physics
26	Invited Lecture Title: Surface analysis for industrial and biomedical applications: A ToF-SIMS perspective of biomolecules Speaker：Dr. Ivan Kempson Senior Research Fellow, University of South Australia Date &Time：10: Add to Reading List Source URL: english.ipe.cas.cn Language: English - Date: 2014-06-06 02:17:53 Secondary ion mass spectrometry Static secondary-ion mass spectrometry Mass spectrometry Scientific method Science
27	BOOK REVIEWS SECONDARY ION MASS SPECTROMETRY IN THE EARTH SCIENCES* The Mineralogical Association of Canada Short Course Series Volume 41, Secondary Ion Mass Spectrometry in the Earth Sciences – Gleaning the Add to Reading List Source URL: www.elementsmagazine.org Language: English - Date: 2010-04-14 07:53:24 Science Secondary ion mass spectrometry Sputtering Ion beam Static secondary-ion mass spectrometry Sensitive high-resolution ion microprobe Chemistry Mass spectrometry Scientific method
28	Curriculum Vitae Reinhard Kozdon Reinhard Kozdon, Assistant Research Professor Department of Marine and Coastal Sciences Add to Reading List Source URL: marine.rutgers.edu Language: English - Date: 2015-02-26 15:54:26 Foraminifera Uranium-lead dating Secondary ion mass spectrometry Chemistry Isotope analysis Isotopes
29	Atmos. Chem. Phys., 14, 10547–10563, 2014 www.atmos-chem-phys.netdoi:acp © Author(sCC Attribution 3.0 License. Ion – particle interactions during particle formation and Add to Reading List Source URL: www.atmos-chem-phys.net Language: English - Date: 2014-10-09 08:53:46 Ion source Ions Ion Alpha particle Corona discharge Static secondary-ion mass spectrometry Chemistry Physics Radioactivity
30	SIMS – Basic Concepts & Design The Basics Secondary Ion Mass Spectrometry (SIMS), also known as the ion probe, is a ‘destructive’ analytical technique. This means that part of the sample is physically removed by th Add to Reading List Source URL: jdlc.curtin.edu.au Language: English - Date: 2015-03-22 22:48:10 Laboratory techniques Secondary ion mass spectrometry Ion source Sensitive high-resolution ion microprobe Sputtering Sector instrument Ion Static secondary-ion mass spectrometry Focused ion beam Chemistry Mass spectrometry Scientific method